NIST
[skip navigation]National Institute of Standards and TechnologyNational Institute of Standards and Technology - TimeNational Institute of Standards and Technology - Home PageNational Institute of Standards and Technology - About NISTNational Institute of Standards and Technology - Contact UsNational Institute of Standards and Technology - A-Z Site IndexNIST Physical Measurement LaboratoryPML Semiconductor & Dimensional Metrology DivisionSDMD Dimensional Metrology GroupSDMD Surface & Nanostructure Metrology GroupSDMD Nanoscale Metrology GroupSDMD Nanoelectronics GroupSDMD Advanced Device Reliability & Characterization Group
  ENGINEERING METROLOGY TOOLBOX  
 Selected Publications 

Selected Publications is a web-based collection of publications about dimensional metrology.

Download Free Acrobat Reader
PDF Icon

Measurement Assurance Program—A Case Study: Length Measurements;  Part 1. Long Gage Blocks (5 in to 20 in); NBS Monograph 149; 1975


Pontius, P.

NBS Monograph 149; 75p. November 1975.

Keywords:
Measurement algorithm; measurement assurance; measurement process; measurement unit; process variability; uncertainty.

Abstract:
The differences between the methods of traditional metrology and the measurement assurance programs are briefly discussed. The historical data relative to long gage blocks (5 in to 20 in) are analyzed to provide a basis for comparison with results from new measurement processes formulated in accordance with the philosophies of the measurement assurance programs. The results from the new processes are in agreement with the work of the past. The current length values used in the dissemination of length by the National Bureau of Standards. These long blocks are a part of a growing collection of similar well characterized artifact standards for use in comparative measurement processes. The methods and techniques used in developing the new measurement process are discussed in some detail. It is the author's intent that, in addition to the technical content, this paper be largely tutorial in the area of measurement process analysis. This paper is, in essence, a report on the extension of the techniques first suggested in NBS Monograph 103 "Realistic Uncertainties and the Mass Measurement Process" to the area of length measurement


Return to Top of Document

Web Site Home: Engineering Metrology Toolbox
Technical Inquiries: Ted Doiron, Group Leader
Dimensional Metrology
Semiconductor and Dimensional Metrology Division
Physical Measurement Laboratory
NIST, 100 Bureau Drive, Stop 8211, Gaithersburg, MD 20899-8211

The National Institute of Standards and Technology (NIST) is an agency of the U.S. Department of Commerce.
NIST / PML / Semiconductor and Dimensional Metrology Division

NIST Program Questions: Public Inquires Unit
(301) 975-NIST (6478) TTY (301) 975-8295
NIST, 100 Bureau Drive, Stop 3460, Gaithersburg, MD 20899-3460

Privacy Policy / Security Notice / Accessibility Statement / Disclaimer / Freedom of Information Act (FOIA) / 
Environmental Policy Statement / No Fear Act Policy / ExpectMore.gov (performance of federal programs) / 
NIST Information Quality Standards / Scientific Integrity Summary

Date Created: Friday, October 18, 2002
Last Updated: Wednesday, December 28, 2011
Technical Web Site Questions: Jay Zimmerman
Feedback and Comments: Webmaster